環境(jing)可靠性(xing)(xing)檢(jian)(jian)(jian)測(ce)(ce)(ce)，是(shi)評估產(chan)(chan)(chan)品(pin)(pin)在特(te)定(ding)(ding)(ding)環境(jing)、規定(ding)(ding)(ding)時間內可靠性(xing)(xing)的(de)(de)(de)一種(zhong)檢(jian)(jian)(jian)測(ce)(ce)(ce)方(fang)法(fa)(fa)。環境(jing)可靠性(xing)(xing)檢(jian)(jian)(jian)測(ce)(ce)(ce)能夠(gou)客(ke)觀反映出，產(chan)(chan)(chan)品(pin)(pin)在設計、生產(chan)(chan)(chan)、運輸(shu)等(deng)環節(jie)中(zhong)存在的(de)(de)(de)缺陷，有(you)利于(yu)改善(shan)產(chan)(chan)(chan)品(pin)(pin)完(wan)好度，提高產(chan)(chan)(chan)品(pin)(pin)質量，減少維(wei)修成本。環境(jing)可靠性(xing)(xing)檢(jian)(jian)(jian)測(ce)(ce)(ce)的(de)(de)(de)方(fang)面還有(you)產(chan)(chan)(chan)品(pin)(pin)的(de)(de)(de)壽(shou)(shou)(shou)(shou)(shou)(shou)命(ming)(ming)特(te)征，對于(yu)大(da)部分(fen)(fen)電子(zi)產(chan)(chan)(chan)品(pin)(pin)而言，使(shi)(shi)用(yong)(yong)(yong)壽(shou)(shou)(shou)(shou)(shou)(shou)命(ming)(ming)是(shi)可靠性(xing)(xing)的(de)(de)(de)zui主要的(de)(de)(de)指標(biao)。環境(jing)可靠性(xing)(xing)檢(jian)(jian)(jian)測(ce)(ce)(ce)在電子(zi)產(chan)(chan)(chan)品(pin)(pin)領域也等(deng)同于(yu)壽(shou)(shou)(shou)(shou)(shou)(shou)命(ming)(ming)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)，可分(fen)(fen)為存儲壽(shou)(shou)(shou)(shou)(shou)(shou)命(ming)(ming)（非工(gong)作狀態）試(shi)(shi)(shi)(shi)驗(yan)和(he)工(gong)作壽(shou)(shou)(shou)(shou)(shou)(shou)命(ming)(ming)（工(gong)作狀態）試(shi)(shi)(shi)(shi)驗(yan)。由于(yu)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)產(chan)(chan)(chan)品(pin)(pin)使(shi)(shi)用(yong)(yong)(yong)壽(shou)(shou)(shou)(shou)(shou)(shou)命(ming)(ming)的(de)(de)(de)時間較(jiao)長(chang)，一般都會采用(yong)(yong)(yong)加(jia)速壽(shou)(shou)(shou)(shou)(shou)(shou)命(ming)(ming)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)，也就是(shi)在不(bu)改變產(chan)(chan)(chan)品(pin)(pin)的(de)(de)(de)失效(xiao)機理(li)和(he)增添新的(de)(de)(de)失效(xiao)因子(zi)的(de)(de)(de)前提下，提高試(shi)(shi)(shi)(shi)驗(yan)應力，以加(jia)速產(chan)(chan)(chan)品(pin)(pin)的(de)(de)(de)失效(xiao)過程。這樣做不(bu)僅(jin)可以大(da)大(da)縮短(duan)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)周期，還能夠(gou)降低環境(jing)可靠性(xing)(xing)檢(jian)(jian)(jian)測(ce)(ce)(ce)費(fei)用(yong)(yong)(yong)，被(bei)普(pu)遍應用(yong)(yong)(yong)。環境(jing)可靠性(xing)(xing)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)中(zhong)不(bu)會等(deng)到所有(you)樣品(pin)(pin)失效(xiao)才終(zhong)止(zhi)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)，即(ji)大(da)部分(fen)(fen)壽(shou)(shou)(shou)(shou)(shou)(shou)命(ming)(ming)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)都是(shi)截(jie)尾(wei)(wei)試(shi)(shi)(shi)(shi)驗(yan)。根據(ju)截(jie)尾(wei)(wei)方(fang)式可靠性(xing)(xing)壽(shou)(shou)(shou)(shou)(shou)(shou)命(ming)(ming)檢(jian)(jian)(jian)測(ce)(ce)(ce)可以分(fen)(fen)為：無替(ti)(ti)換(huan)定(ding)(ding)(ding)時截(jie)尾(wei)(wei)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)、有(you)替(ti)(ti)換(huan)定(ding)(ding)(ding)時截(jie)尾(wei)(wei)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)、無替(ti)(ti)換(huan)定(ding)(ding)(ding)數截(jie)尾(wei)(wei)檢(jian)(jian)(jian)測(ce)(ce)(ce)、有(you)替(ti)(ti)換(huan)定(ding)(ding)(ding)數截(jie)尾(wei)(wei)檢(jian)(jian)(jian)測(ce)(ce)(ce)。這里涉及(ji)多個檢(jian)(jian)(jian)測(ce)(ce)(ce)因素(su)，是(shi)否替(ti)(ti)換(huan)、固定(ding)(ding)(ding)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)時間、固定(ding)(ding)(ding)失效(xiao)樣品(pin)(pin)數，因此在后期進(jin)行數據(ju)分(fen)(fen)析(xi)時，需(xu)要涉及(ji)多種(zhong)分(fen)(fen)析(xi)方(fang)法(fa)(fa)，常用(yong)(yong)(yong)的(de)(de)(de)統(tong)計分(fen)(fen)析(xi)有(you)：概率紙(zhi)圖解法(fa)(fa)、zui大(da)似(si)然(ran)估計法(fa)(fa)、線(xian)性(xing)(xing)無偏(pian)估計法(fa)(fa)、線(xian)性(xing)(xing)不(bu)變估計法(fa)(fa)等(deng)。

值(zhi)得注意的(de)是，環境可靠性大(da)多數都是采用(yong)外加應力測試(shi)，通(tong)過施加應力提前發現(xian)早期失效產品(pin)并(bing)(bing)剔除(chu)。要求掌握產品(pin)的(de)失效分布和失效機(ji)理，確定合(he)理的(de)檢(jian)測項目，并(bing)(bing)加以(yi)測試(shi)。較完善的(de)環境可靠性檢(jian)測包含以(yi)下五種檢(jian)測方(fang)法：

1、目檢（顯微鏡鏡檢、X射線(xian)照相、紅(hong)外掃描等(deng)）

2、電(dian)性能測試(shi)

3、密封檢漏

4、環(huan)境應力篩選（恒(heng)定加速(su)、機械振動、沖擊、溫(wen)度(du)循(xun)環(huan)、熱沖擊等）

5、壽命篩選(xuan)（溫度沖擊、光老化、疲勞耐(nai)久等）